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UBM Tech's Test & Measurement World Announces the Best in Test Finalists
SAN FRANCISCO, Dec. 5, 2012 /PRNewswire via COMTEX/ --
UBM Tech's Test & Measurement World today announced the finalists of the Best in Test Awards competition, selected by the editors of Test & Measurement World. The awards recognize the best in test products and test professionals.
(Logo: http://photos.prnewswire.com/prnh/20121205/SF24751LOGO)
The program comprises three main categories - the Best in Test Product Awards, the Test of Time Awards, and Test Engineer of the Year Award. Test & Measurement World readers are asked to vote online for the award winners at http://tmworld.com/electronics-blogs/other/4402438/Best-in-Test-voting-is-underway through December 31, 2012. Winners will be announced during the Best in Test 2013 Awards ceremony on January 31, 2013 during a ceremony held in the Chiphead Theater in conjunction with DesignCon 2013, which takes place January 28-31, 2013 at the Santa Clara Convention Center in Santa Clara, California.
"Since 1991 we have had the annual tradition of selecting the Best in Test Award winners," said Janine Love, Editor in Chief, Test & Measurement World, UBM Tech. "We received an outstanding group of new innovative products and services this year. We look forward to hearing what our readers think of these selections and which products they believe will define our industry for years to come."
The Best in Test Product Awards honor important and innovative new products and services in the electronics test and measurement industry. Products from all areas of electronics testing and inspection are eligible. The annual Test of Time Award is presented to a product that continues to provide state-of-the-art service more than five years after its introduction. The Test Engineer of the Year Award pays tribute to the important contributions test engineers make to the quality of electronics components, products and systems. The award winner receives a $10,000 educational grant, courtesy of sponsor National Instruments, which is presented to an engineering school designated by the winner.
The Best in Test finalists include:
ATE/Production Test
Diamondx Test Platform; LTX-Credence
Advantest T2000 Integrated Massive Parallel Test Solution (IMS); Advantest Corporation
TR7680 3D Automated X-Ray Inspection; Test Research, Inc.
Multi-Function Application Board for in-circuit testers; Teradyne
7700 Integrated Microwave Test System; Aeroflex
WLAN Boundary Scan Controller SFX/WSL1149-(x); GOEPEL electronic
Compliance Test
R&S ESR EMI test receiver; Rohde & Schwarz
R&S VTC Video test center; Rohde & Schwarz
Fluke Networks TS'54 TDR VDV telephone test set; Fluke Networks
Data Acquisition
PXIe-9848: 8-CH 14-bit 100 MS/s High-Speed PXI Express Digitizer; ADLINK Technology
QuantumX MX1615 Strain Gauge Bridge Amplifier; HBM Test & Measurement
Stand-Alone NI CompactDAQ System; National Instruments
DT8824-HV Ethernet Data Acquisition Module; Data Translation, Inc.
Digital Multimeters
GX2065 - 6.5 Digit, Performance DMM & 3MS/s Digitizer; Geotest-Marvin Test Systems
U1177A Infrared-to-Bluetooth® adapter for multimeters; Agilent Technologies
LTE/Wireless Test
Spirent Hybrid Location Technology Solution (HLTS); Spirent Communications
RP-5300 Multi-Channel RF Recorder; Averna
ZT8201 6 GHz VSA and VSG One-Box Solution; ZTEC Instruments
ACE MX2 MIMO channel emulator; Azimuth Systems
EB Propsim F32 radio channel emulator; Elektrobit (EB)
Spirent Landslide Wi-Fi Offload Gateway Test Solution; Spirent Communications
Machine Vision/Inspection
TR7007 SII Solder Paste Inspection; Test Research, Inc.
OptiCon SPI-Line 3D Solder Paste Printing Measurement; GOEPEL electronic
Piranha HS NIR 8k camera; Teledyne DALSA
Optical/Network Test
Landslide Mobile Infrastructure Security Test Solution; Spirent Communications
MultiFiber Pro Optical Power Meter and Light Source; Fluke Networks
OneTouch AT Network Assistant; Fluke Networks
TeraVM Virtualized Network Solution; Shenick Network Systems
Xair LTE Basestation Validation Solution; Ixia
AFL Noyes M310 OTDR; AFL
CS260-10 Live PON OTDR; AFL
FLX380 FlexTester Handheld OTDR; AFL
AFL-NOYES FOCIS Fiber Optic Connector Inspection System; AFL
Power Supply
DL Series Electronic DC Loads; Global Test Solutions
ASD Programmable Precision High-Power DC Power Supply; AMETEK Programmable Power, Inc
Model 2657A High Power System SourceMeter® instrument; Keithley Instruments, Inc.
Aktakom APS -73xxL Series of Programmable Power Supplies; T&M Atlantic
U2020 X-series USB peak power sensors; Agilent Technologies
RF/MW Test
RF Studio signal-processing and analysis tools; Averna
DOCSIS Channel Emulator; Averna
Agilent U1810B USB Coaxial Switch, DC - 18 GHz, SPDT; Agilent Technologies
NI PXIe-5644R RF vector signal transceiver (VST); National Instruments
3550 Digital Radio Test System; Aeroflex
Series 7000 Radio Channel Replicator; Eastern Optx Inc.
PSM3000, PSM4000 and PSM5000 Series RF and Microwave Power Sensors/Meters; Tektronix
Oscilloscopes
DS2000 Digital Oscilloscope; Rigol Technologies
HDO High Definition Oscilloscopes; Teledyne LeCroy
LabMaster 10 Zi 65 GHz Oscilloscope; Teledyne LeCroy
Tektronix Visual Trigger; Tektronix
InfiniiVision 4000 X-Series Oscilloscope; Agilent Technologies
DLM4000 Mixed Signal Oscilloscope; Yokogawa Corp
Infiniium 90000 Q-Series Oscilloscopes; Agilent Technologies
Semiconductor Test
ScanWorks® FPGA-Controlled Test (FCT) Memory Test Instruments; ASSET Intertech
T2000 LJC16 6-channel, low-jitter-clock module; Advantest
Tessent TestKompress with Cell-Aware Testing; Mentor Graphics
Signal Analyzers
M9703A AXIe High-Speed Digitizer, 8-channel, 12-bit, up to 3.2 GS/s (DDC capability); Agilent Technologies
VectorStar ME7838A (frequency extended to 750GHz); Anritsu Company
DSA815-TG spectrum analyzer; Rigol Technologies
CS1104 Scout Broadband Signal Analyzer; Aeroflex
Tektronix OM4000 Coherent Lightwave Signal Analyzer; Tektronix
Signal Integrity/High-speed test
MP1800A 32G Multi-channel Solution; Anritsu Company
BERTScope Bit Error Rate Tester; Tektronix
Introspective ESP software-defined, real-time BER / signal-integrity analyzer instrument-on-chip; DFT Microsystems
Signal Source
M9381A PXIe Vector Signal Generator; Agilent Technologies
33500B Series Waveform Generators with Trueform Technology; Agilent Technologies
MG3710A Vector Signal Generator; Anritsu Company
MXG X-Series Signal Generator; Agilent Technologies
GX1649 - 64 Channel PXI Arbitrary Waveform Generator and D to A; Geotest-Marvin Test Systems
ZT8751 6 GHz Vector Signal Generator; ZTEC Instruments
AFG2000 Series Arbitrary/Function Generator; Tektronix
Software
TestShell 4.8 for lab management; QualiSystems
Certus 2.0 ASIC Prototyping Debug Solution; Tektronix
TOSCA Testsuite 7.5; TRICENTIS
Tessent IJTAG; Mentor Graphics
SDAIII CompleteLinQ multi-lane serial data analysis software; Teledyne LeCroy Black Belt 5.0 .Automated Test Data Collection; IntraStage
The Test of Time finalists include:
PZ4000 Power Analyzer (1999); Yokogawa Corporation
WaveSurfer Xs Scope (2006); Teledyne LeCroy Corp.
ATEasy (1991) Test Executive and Test Development Softwarer Suite; Geotest - Marvin Test Systems
TestStation (1999) ATE Low Voltage Tester; Teradyne, Inc.
Aardvark (2003) I2C/SPI Host Adapter; Total Phase
T12 Digital Torque Transducer (2005); HBM Test and Measurement
DesignWare STAR Memory System (2001); Synopsys
SoMat eDAQlite (2004) Mobile data acquisition system; HBM Test and Measurement
MT9510 Pick and Place Test Handler (1997); Multitest
TOSCA Test Suite 1.0 (2006); Tricentis
The Test Engineer of the Year finalists include:
Daniel Chow, PhD, Altera
Steve Sandler, Picotest
Peter Spitzer, TRICENTIS
Kevin Henderson, Qualcomm Atheros
David Finnie, CACI
To vote on the award finalists, visit: http://tmworld.com/electronics-blogs/other/4402438/Best-in-Test-voting-is-underwayhttp://www.tmworld.com/article/520453-Finalists_for_T_MW_s_2012_awards.php
About UBM TechUBM Tech is a global media business that provides information, events, training, data services, and marketing solutions for the technology industry. Its media brands and information services inform and inspire decision makers across the entire technology market -- engineers and design professionals, software and game developers, solutions providers and integrators, networking and communications executives, and business technology professionals. UBM Tech's industry-leading media brands include EE Times, Interop, Black Hat, InformationWeek, Game Developer Conference, CRN, and DesignCon. The company's information products include research, education, training, and data services that accelerate decision making for technology buyers. UBM Tech also offers a full range of marketing services based on its content and technology market expertise, including custom events, content marketing solutions, community development and demand generation programs. UBM Tech is a part of UBM (UBM.L), a global provider of media and information services with a market capitalization of more than $2.5 billion.
For more information on UBM Tech please contact:Felicia Hamerman, Vice President, Marketing, ElectronicsT: 516.562.5652, E: felicia.hamerman@ubm.com
For more information on the Best in Test Awards, please contact:Janine Love, Editor in Chief, Test & Measurement WorldM: 973.864.7238, E: janine.love@ubm.com
Available Topic Expert(s): For information on the listed expert(s), click appropriate link.Janine Lovehttps://profnet.prnewswire.com/Subscriber/ExpertProfile.aspx ei=109766
SOURCE UBM Tech
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